A1365: Low-Noise, High-Precision, Programmable Linear Hall-Effect Sensor IC with High-Bandwidth (120 kHz) Analog Output and Integrated Fault Comparator

The A1365 linear output Hall-effect sensor IC is specifically designed to provide a highly accurate output with improved resolution at high bandwidth for use in current-sensing applications. This device employs a segmented, linearly interpolated temperature compensation technology, which provides greater accuracy in sensitivity and offset voltage trimming and hence virtually zero temperature drift. This improvement greatly reduces the total error of the device across the operating temperature range.

The highly programmable Over Field Fault signal (FAULT pin) can be used to detect a high magnetic field condition. Broken ground wire detection, undervoltage lockout for V_CC below specification, and user-selectable output voltage clamps are also included, which are important for high reliability in automotive applications. The sensor accuracy and diagnostic capability make it ideally suited for automotive sockets such as HEV inverter and DC-to-DC converter applications.

The A1365 Hall-effect sensor IC is extremely sensitive, fast, and temperature-stable. The accuracy and flexibility of this device is enhanced by user programmability, performed via the V_CC supply and the output pins, which allows the device to be optimized in the application.

This ratiometric Hall-effect sensor IC provides a voltage output that is proportional to the applied magnetic field. The quiescent output voltage is user-adjustable around 50% (bidirectional) of the supply voltage, V_CC. The device sensitivity is adjustable within the range of 0.6 to 14 mV/G.

The A1365 incorporates a highly sensitive Hall element with a BiCMOS interface integrated circuit that employs temperature compensation circuitry to reduce the intrinsic sensitivity and offset drift of the Hall element. The IC also includes a small-signal high-gain amplifier, a clamped low-impedance output stage, and a proprietary high-bandwidth dynamic offset cancellation technique.

Device specifications apply across an extended ambient temperature range: –40°C to 150°C. The A1365 sensor IC is provided in an extremely thin case (1 mm thick), 4-pin SIP (single inline package, suffix KT) that is lead (Pb) free, with 100% matte-tin leadframe plating. The thin package allows for better magnetic coupling because the smaller the air gap in the core is, the higher the coupling from current to magnetic field will be.

• Proprietary segmented linear temperature compensation (TC) technology provides a typical accuracy of 1% over the full operating temperature range
• Self-Test diagnostic mode can be used to achieve a high level of functional safety within a system
• 120 kHz nominal bandwidth achieved via proprietary packaging and chopper stabilization techniques
• Over Field Fault signal with 6-bit programmable trigger levels, 2-bit programmable hysteresis, and latching or non-latching behavior
• Over Field Fault response time < 4.5 μs (typ)
• Extremely low noise and high resolution achieved via proprietary Hall element and low-noise amplifier circuits
• Customer-programmable, high-resolution offset and sensitivity trim
• Available in a 1-mm-thick SIP through-hole package
• Factory-programmed sensitivity and quiescent output voltage TC with extremely stable temperature performance
• Selectable sensitivity range between 0.6 and 14 mV/G through use of coarse sensitivity program bits
• Ratiometric sensitivity, quiescent voltage output, and clamps enable simple interface with application A-to-D converter (ADC)
• Output voltage clamps provide short-circuit diagnostic capabilities
• Open-circuit detection on ground pin (broken wire)
• Undervoltage lockout for VCC below specification
• Wide ambient temperature range: –40°C to 150°C