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Semiconductor Packaging Publications
Back-Biased Packaging Advances
Chemical Exposure of Devices
Guidelines for Designing Subassemblies Using Hall-Effect Devices
Soldering Methods for Allegro Products (SMD and Through-Hole)
Wettable Flank Plated PQFN
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Semiconductor Packaging Publications
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Package Designators
(PDF)
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Package Thermal Characteristics
(PDF)
Back-Biased Packaging Advances
Chemical Exposure of Devices
Guidelines for Designing Subassemblies Using Hall-Effect Devices
(PDF)
Improving Batwing Power Dissipation
(PDF)
Procedure for Measuring Pad-to-Ambient Thermal Resistance (R
θPA
) for Exposed Pad Packages
(PDF)
Soldering Methods for Allegro's Products — SMD and Through-Hole
Thermal Design for Plastic Integrated Circuits
(PDF)
Wettable Flank Plated PQFN
Guidelines for Leadforming Using Back-Biased Hall-Effect Devices
