Low-Noise, High-Precision Linear Hall-Effect Sensor IC with Integrated Fault Comparator

A1365

The A1365 provides high-accuracy current sensing with a self-test diagnostic mode, programmable offset and sensitivity, and an integrated fault comparator for enhanced system reliability.

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Top Features

Proprietary segmented linear temperature compensation (TC) technology provides a typical accuracy of 1% over the full operating temperature range
Self-Test diagnostic mode can be used to achieve a high level of functional safety within a system
120 kHz nominal bandwidth achieved via proprietary packaging and chopper stabilization techniques
Over Field Fault signal with 6-bit programmable trigger levels, 2-bit programmable hysteresis, and latching or non-latching behavior
Over Field Fault response time < 4.5 μs (typ)
Extremely low noise and high resolution achieved via proprietary Hall element and low-noise amplifier circuits
Customer-programmable, high-resolution offset and sensitivity trim
Available in a 1-mm-thick SIP through-hole package
Factory-programmed sensitivity and quiescent output voltage TC with extremely stable temperature performance
Selectable sensitivity range between 0.6 and 14 mV/G through use of coarse sensitivity program bits
Ratiometric sensitivity, quiescent voltage output, and clamps enable simple interface with application A-to-D converter (ADC)
Output voltage clamps provide short-circuit diagnostic capabilities
Open-circuit detection on ground pin (broken wire)
Undervoltage lockout for VCC below specification
Wide ambient temperature range: –40°C to 150°C